背光成像技术测量冷冻靶参数研究进展

建立了可见光背光成像装置，测量距离实现了4~30 cm可调，对应分辨率为0.7 ~4.6 μm，并可对样品仓内的冷冻靶进行有效的中心定位，定位精度达0.1 mm，获得了不同分辨率下的塑料靶球与玻璃靶球的背光影像。通过获得背光图像的能量密度图及靶球的光路追踪模型，建立了靶球内部DD/DT冰层厚度的精确测量及计算方法。研究发现，将背光成像技术与干涉条纹法相结合可获得一种无损测量透明聚变靶丸材料折射率的方法。结果表明，背光成像技术是透明冷冻靶有效的诊断方法。

Progress of Research in Cryogenic Target Characterization Using Backlit Shadowgraph

The equipment of visible light backlit shadowgraph was built,and 0.7-4.6 μm resolution corresponding to 4-30 cm measured distance was acquired.The target in sample room could be accurately fixed within 0.1 mm.A backlit shadowgraph technique was developed.The different resolution shadowgraphs of plastic and glass targets were gained using this technique.The precise measurement and calculation method were built for studying DD/DT ice thickness by gaining the ray energy density image and ray trace model of target.The research detection using shadowgraph and ray interfere technique together could obtain a method of nondestructive measure refractive index of plastic targets.The result shows that the backlit shadowgraph is valid for diagnosing transparent cryogenic target parameter.