| 空间辐照环境下的FPGA可靠性设计技术 |
| |
| 引用本文： | 李巍,刘栋斌. 空间辐照环境下的FPGA可靠性设计技术[J]. 单片机与嵌入式系统应用, 2011, 11(10): 12-14 |
| |
| 作者姓名： | 李巍 刘栋斌 |
| |
| 作者单位： | 中国科学院长春光机所空间一部,长春,130022 |
| |
| 摘 要： | 为了使基于SRAM结构的FPGA系统能够在空间辐照环境下稳定、安全、可靠地运行，FPGA软件的高可靠性设计便显得尤为重要。本文分析了空间辐照条件下FPGA发生故障的原因和机理，并结合实际设计的空间载荷项目，着重从软件方面提出了防范和解决的措施和方案。最后通过仿真和环境实验，验证了设计方案的可行性。
|
| 关 键 词： | FPGA 单粒子翻转 三模冗余 纠错电路 |
High Reliability Design Technology of FPGA under Aerospace Radiation |
| |
| Li Wei,Liu Dongbin. High Reliability Design Technology of FPGA under Aerospace Radiation[J]. Microcontrollers & Embedded Systems, 2011, 11(10): 12-14 |
| |
| Authors: | Li Wei Liu Dongbin |
| |
| Affiliation: | (Fin Mechanics and Physics,Changchun Institute of Optics,Chinese Academy of Science, Changchun 130033 ,China) |
| |
| Abstract: | In order to make the FPGA system based on SRAM structure work stable, safe and reliable under aerospace radiation, the FPGA software design becomes more and more important. This paper analyses the causes of the FPGA working faults under high radia tion. Based on our design project, the paper puts forward the measure and plan to avoid and solve the problem, emphasizing FPGA soft ware design. The feasibility of the project is proved through software simulation and environmental experiment. |
| |
| Keywords: | FPGA single event upset triple modular redundancy error detected and corrected |
| 本文献已被 CNKI 维普 万方数据 等数据库收录！ |
|
