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Measuring the local resistivity by the nanoindentation and force-spectroscopy methods |
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| Authors: | A. I. Soshnikov K. S. Kravchuk I. I. Maslenikov D. V. Ovchinnikov V. N. Reshetov |
| Affiliation: | 16600. Technological Institute of Superhard and Novel Carbon Materials, ul. Tsentral’naya 7A, Troitsk, Moscow oblast, 142190, Russia 26600. Moscow Institute of Physics and Technology, Institutskii per. 9, Dolgoprudnyi, Moscow oblast, 141700, Russia 36600. Moscow Engineering Physics Institute (MEPhI), National Research Nuclear University, Kashirskoe sh. 31, Moscow, 115409, Russia |
| Abstract: | Methods for measuring the resistivity of materials during elastic and elastoplastic interactions of a current-conducting indenter and a studied sample are described. Analytical methods that describe the dependences of the contact ohmic resistance on the pressure force and the contact stiffness are proposed. The considered models are experimentally tested with a NanoScan scanning nanohardness tester using indenters made of boron-doped diamond single crystals. |
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