Substrate noise-coupling characterization and efficient suppression in CMOS technology |
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| Authors: | Wen-Kuan Yeh Shuo-Mao Chen Yean-Kuen Fang |
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| Affiliation: | Dept. of Electr. Eng., Nat. Univ. of Kaohsiung, Taiwan; |
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| Abstract: | This brief investigates the substrate noise coupling using S-parameters measurement. Radio frequency domain analysis shows that the noise isolation is strongly dependent on layout geometry, including the parameters such as p-n junction, physical separation distance, guard ring (GR), and deep n-well (DNW). We found that the noise coupling can be efficiently diminished by incorporating GR and DNW structures. |
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