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The anomalous microstructural,tensile, and aging response of thin-cast Sn3.9Ag0.6Cu lead-free solder
Authors:Qiang Xiao  Luu Nguyen  William D. Armstrong
Affiliation:(1) Department of Mechanical Engineering, University of Wyoming, 82071 Laramie, WY;(2) National Semiconductor Corporation, 95052 Santa Clara, CA
Abstract:In this study, bulk and thin-cast samples were produced with an identical Sn3.9Ag0.6Cu composition. The thin-cast material exhibited a much finer as-quenched microstructure than the bulk material with the intermetallic compound (IMC) phase restricted to a thin network. Both the bulk and thincast materials continually softened during room-temperature aging, while both materials initially softened and then subsequently hardened when aged at 120°C and 180°C. The thin-cast material was in all cases significantly softer than the bulk material, and responded to aging as if it were bulk material aged at a higher temperature. These results have significant implications for the elevated temperature application of Sn3.9Ag0.6Cu.
Keywords:Sn-Ag-Cu lead-free solder  aging response  microstructural changes  tensile properties
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