Calibration of instrument and sample parameters for small angle X-ray scattering |
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Authors: | Yanru Wei |
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Affiliation: | 1. Institute of Health Sciences, Anhui University, Hefei, China;2. Beijing Synchrotron Radiation Facility, Institute of High Energy Physics, Chinese Academy of Sciences, Beijing, China |
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Abstract: | A method for calibrating the parameters of a small angle X-ray scattering instrument using the diffraction ring of a standard sample is presented. A generalized geometric model for small angle X-ray scattering was constructed and detailed mathematical derivations presented to solve for the relevant instrument parameters, which were then used to convert two-dimensional small angle X-ray scattering data to standard curves. The method is valid regardless whether the detector photosensitive plane is perpendicular or tilted with respect to the beam. Small angle X-ray scattering was performed using standard calibration samples to validate the methodology. |
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Keywords: | Detector tilt instrument parameters small angle X-ray scattering small angle X-ray scattering calibration |
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