New method for thickness determination and microscopic imaging of graphene-like two-dimensional materials |
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| Authors: | Qin Xudong Chen Yonghai Liu Yu Zhu Laipan Li Yuan Wu Qing Huang Wei |
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| Affiliation: | Key Laboratory of Semiconductor Materials Science and Beijing Key Laboratory of Low Dimensional Semiconductor Materials and Devices, Institute of Semiconductors, Chinese Academy of Sciences, Beijing 100083,China |
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| Abstract: | We employed the microscopic reflectance difference spectroscopy (micro-RDS) to determine the layer-number and microscopically image the surface topography of graphene and MoS2 samples. The contrast image shows the efficiency and reliability of this new clipping technique. As a low-cost, quantifiable, no-contact and non-destructive method, it is not concerned with the characteristic signal of certain materials and can be applied to arbitrary substrates. Therefore it is a perfect candidate for characterizing the thickness of graphene-like two-dimensional materials. |
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| Keywords: | graphene two-dimensional materials microscopic reflectance difference spectroscopy microscopic morphology Raman spectra surface topography |
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