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GaAs集成电路芯片在片直接故障检测分析
引用本文:田小建,张大明,孙伟,衣茂斌. GaAs集成电路芯片在片直接故障检测分析[J]. 激光杂志, 2000, 21(2): 23-24
作者姓名:田小建  张大明  孙伟  衣茂斌
作者单位:集成光电子学国家重点联合实验室吉林大学实验区!长春130023
摘    要:介绍了一种实用的电光采样测试系统 ,其稳定的光学系统结构可保持精度几年不变 ,单位带宽电压灵敏度为 2 5 2mV/Hz。改进了电子移相扫描法 ,利用倍频移相扫描法对GaAs动态分频器芯片故障进行了在片检测分析。

关 键 词:集成电路芯片 故障检测 砷化镓

Direct fault detection and analysis of GaAs IC's chip on wafer
Tian Xiaojian,Zhang Daming,Sun Wei,Yi Maobin. Direct fault detection and analysis of GaAs IC's chip on wafer[J]. Laser Journal, 2000, 21(2): 23-24
Authors:Tian Xiaojian  Zhang Daming  Sun Wei  Yi Maobin
Abstract:This paper introduced a practical electro optic Sampling system,its optical system construction can hold the stability with designed precision for a few years,the voltage sensitivity of unit detection bandwidth is 2.52mV/Hz.Improved the method of electronic phase shift scanning,and the fault detection and analysis for the GaAs dynamic divider chip have been made using double frequency phase shift scanning.
Keywords:electro optic sampling  integrated circuit chip  fault detection
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