Microprocessor IDDQ testing: a case study |
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Authors: | Josephson D Storey M Dixon D |
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Affiliation: | Hewlett-Packard Co., Fort Collins, CO; |
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Abstract: | The author describe their incorporation of IDDQ testing into the design of the PA-7100LC PA-RISC microprocessor. They also discuss design guidelines, measurement techniques, results after fabrication and volume production, and suggested improvement. Their 900,000-transistor custom design supports IDDQ testing to ensure high quality without compromising 100-MHz-plus performance |
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