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Interface chemical states of NiO/NiFe films and their effects on magnetic properties
作者姓名:于广华  柴春林  朱逢吾  赖武彦
作者单位:YU Guanghua CHAI Chunlin ZHU Fengwu& LAI Wuyan1. Department of Materials Physics,University of Science and Technology Beijing,Beijing 100083,China;2. Institute of Physics & Center for Condensed Matter Physics,Chinese Academy of Sci
基金项目:This work was supported by the National Natural Science Foundation of China (Grant No. 19890310) .
摘    要:Ta/NiOx/Ni81Fe19/Ta multilayers were prepared by rf reactive and dc magnetron sputtering. The exchange coupling field ( Hex) and the coercivity ( Hc) of NiOx/Ni81Fe19 as a function of the ratio of Ar to O2 during the deposition process were studied. The composition and chemical states at the interface region of NiOx/NiFe were also investigated using the X-ray photoelectron spectroscopy (XPS) and peak decomposition technique. The results show that the ratio of Ar to O2 has great effect on the nickel chemical states in NiOx film. When the ratio of Ar to O2 is equal to 7 and the argon sputtering pressure is 0.57 Pa, the x value is approximately 1 and the valence of nickel is + 2. At this point, NiOx is antiferromagnetic NiO and the corresponding Hex is the largest. As the ratio of Ar/O2 deviates from 7, the exchange coupling field ( Hex) will decrease due to the presence of magnetic impurities such as Ni +3 or metallic Ni at the interface region of NiOx/NiFe, while the coercivity ( Hc) will increase due to

收稿时间:23 July 2008

Interface chemical states of NiO/NiFe films and their effects on magnetic properties
Guanghua Yu, Chunlin Chai, Fengwu Zhu and Wuyan Lai.Interface chemical states of NiO/NiFe films and their effects on magnetic properties[J].Science in China(Technological Sciences),2002,45(1):27-34.
Authors:Guanghua Yu  Chunlin Chai  Fengwu Zhu and Wuyan Lai
Affiliation:1. Department of Materials Physics,University of Science and Technology Beijing,Beijing 100083,China
2. Institute of Physics & Center for Condensed Matter Physics,Chinese Academy of Sciences,Beijing 100080,China
Abstract:Ta/NiOx/Ni81Fe19/Ta multilayers were prepared by rf reactive and dc magnetron sputtering. The exchange coupling field ( Hex) and the coercivity ( Hc) of NiOx/Ni81Fe19 as a function of the ratio of Ar to O2 during the deposition process were studied. The composition and chemical states at the interface region of NiOx/NiFe were also investigated using the X-ray photoelectron spectroscopy (XPS) and peak decomposition technique. The results show that the ratio of Ar to O2 has great effect on the nickel chemical states in NiOx film. When the ratio of Ar to O2 is equal to 7 and the argon sputtering pressure is 0.57 Pa, the x value is approximately 1 and the valence of nickel is + 2. At this point, NiOx is antiferromagnetic NiO and the corresponding Hex is the largest. As the ratio of Ar/O2 deviates from 7, the exchange coupling field ( Hex) will decrease due to the presence of magnetic impurities such as Ni +3 or metallic Ni at the interface region of NiOx/NiFe, while the coercivity ( Hc) will increase due to the metallic Ni. XPS studies also show that there are two thermodynamically favorable reactions at the NiO/NiFe interface: NiO + Fe = Ni + FeO and 3NiO + 2Fe = 3Ni + Fe2O3. These interface reaction products are magnetic impurities at the interface region of NiO/NiFe. It is believed that these magnetic impurities would have effect on the exchange coupling field ( Hex) and the coercivity (Hc) of NiO/NiFe.
Keywords:NiOx  magnetic impurity  exchange coupling field (Hex)  coercivity (Hc)  X-ray photoelectron spectroscopy (XPS)  
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