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Very low energy electron microscopy of graphene flakes |
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| Authors: | E MIKMEKOVÁ H BOUYANFIF M LEJEUNE I MÜLLEROVÁ M HOVORKA M UN?OVSKÝ L FRANK |
| Affiliation: | 1. Institute of Scientific Instruments ASCR, v.v.i, , Královopolská 147, 61264 Brno, Czech Republic;2. Laboratoire de Physique de la Matière Condensée, Faculté des Sciences d'Amiens, Universite de Picardie Jules Verne, , 33 rue Saint Leu, 80039 Amiens Cedex 2 France;3. FEI Czech Republic, Ltd, , Technická 6, 61200 Brno Czech Republic |
| Abstract: | Commercially available graphene samples are examined by Raman spectroscopy and very low energy scanning transmission electron microscopy. Limited lateral resolution of Raman spectroscopy may produce a Raman spectrum corresponding to a single graphene layer even for flakes that can be identified by very low energy electron microscopy as an aggregate of smaller flakes of various thicknesses. In addition to diagnostics of graphene samples at larger dimensions, their electron transmittance can also be measured at very low energies. |
| Keywords: | Graphene very low energy STEM |