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Sign Invariance in Goodness-of-Fit Tests for Time Series
Authors:T W Anderson  & M A Stephens
Affiliation:Stanford University,;Simon Frazer University
Abstract:A goodness-of-fit test for a stationary stochastic process may be based on a functional of the difference between the sample standardized spectral distribution and a hypothesized standardized spectral distribution. Theorems are given to show that under certain conditions the distribution of such a functional based on observations from a process { yt } indexed by a parameter θ is the same for θ=θ0 and for θ=−θ0. The results are illustrated by three examples of time series processes.
Keywords:Stationary processes  standardized spectral distributions  Kolmogorov–Smirnov statistic  Cramer–von Mises statistic
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