| 提高剥容的金属化聚碳酸酯薄膜电容器的绝缘合格率 |
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| 引用本文： | 顾爱国,叶俊.提高剥容的金属化聚碳酸酯薄膜电容器的绝缘合格率[J].微电子技术,2000,28(3):59-62. |
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| 作者姓名： | 顾爱国 叶俊 |
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| 作者单位： | 上海三叶实业有限公司 |
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| 摘 要： | 本文通过对剥容的金属化聚碳酸酯薄膜电容器的半成品和成品后绝缘性能的不良品进行再一次赋能，成功地提高了剥容产品的绝缘性能和耐压试验后绝缘性能的稳定性，从而使得产品的绝缘合格率有了明显的提高。
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| 关 键 词： | 薄膜电容器 聚碳酸酯 绝缘性能 |
Increase of the Insulation Yield of Stripping Capacitance and Metallizing Polycarbonate Film Capacitors |
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| Affiliation: | Shanghai Sanye Industrial Co Ltd |
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| Abstract: | Insulation property of stripping capacitance product and stability of insulation property after voltage proof have been successfully increased by training repeatedly on stripping capacitance and metallizing polycarbonate film capacitors.Product insulation yield is greatly increased. |
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| Keywords: | Film capacitors Polycarbonate Insulation property Voltage proof Stability Yield |
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