测量噪声功率谱作为筛选光电耦合器件的方法研究（Ⅱ）

在文献「１」中作者曾提出用测量光电耦合器件噪声功能率谱的方法，筛选光电耦合器件。此 根据低频噪声的幅值。但在实验中发现，由于１／ｆ、ｇ－ｒ和爆裂噪声三者之间相关性较弱，在剔除掉１／ｆ噪声值较大的器件后，ｇ－ｒ噪声和爆裂噪声较大的器件却可能未被易除。

The Study on Method of Screening Optoelectronic Coupled Devices Using Noise Power Spectrum Measurement

In Ref. a method of screening optoelectronic coupled devices(OCD) by use of measuring noise power spectrum is proposed.However,in recent experiment it is found that the correlation between low frequency noise(1/f),generation recombination(gr) noise and burst noise is rather weak.When the devices with heavy 1/f noise are rejected,the other devices with gr noise or burst noise can still be left without being screened off.For this reason,in the course of screening the conditions of rejecting devices with gr or burst noises should be included,which can not only improve the reliability of screening devices,but also a more reliable screening method is presented for the case of higher reliability and quality required in rejecting semiconductor devices.