| 光电测试系统的性能分析 |
| |
| 引用本文： | 许卫春,徐可欣,贺忠海.光电测试系统的性能分析[J].传感技术学报,2004,17(4):679-682. |
| |
| 作者姓名： | 许卫春 徐可欣 贺忠海 |
| |
| 作者单位： | 天津大学精密测试技术及仪器国家重点实验室,天津,300072;天津大学精密测试技术及仪器国家重点实验室,天津,300072;天津大学精密测试技术及仪器国家重点实验室,天津,300072 |
| |
| 摘 要： | 文章从理论上分析、计算由近红外光电传感器、前置放大电路和采集卡组成的光电测试系统的精度指标.结果表明,系统的绝对误差为6.68 mV;温度和噪声等引起的相对误差为3.26 mV;此外,采集卡的A/D转换宽度也影响着整个系统的精度.文章分析的方法为类似测试系统的性能分析提供了一般方法.
|
| 关 键 词： | 光电转换 测试系统 性能分析 |
| 文章编号： | 1004-1699(2004)04-0679-04 |
| 修稿时间： | 2004年6月5日 |
Performance Analysis of Photoelectric Measurement Systems |
| |
| XU Weichun,XU Kexin,HE Zhonghai.Performance Analysis of Photoelectric Measurement Systems[J].Journal of Transduction Technology,2004,17(4):679-682. |
| |
| Authors: | XU Weichun XU Kexin HE Zhonghai |
| |
| Affiliation: | State Key Laboratory of Precision Measurement Technology and Instrument , Tianjin University , Tianjin 300072 , China |
| |
| Abstract: | Performance of the photoelectric measurement system which is composed of a near infrared photodiode with preamp and data acquisition board, is discussed. By this method, the precision of the system can be obtained by theoretical analysis. The results show that the absolute accuracy of the system can be 6 68 mV, the relative accuracy caused by temperature fluctuation and noise is 3 26 mV. In addition, the analog to digital converter resolution makes effect on the precision of the whole system. The analysis in this article provides a general method for performance analysis of similar measuring system. |
| |
| Keywords: | photoelectric converter measurement systems performance analysis |
| 本文献已被 CNKI 维普 万方数据 等数据库收录！ |
| 点击此处可从《传感技术学报》浏览原始摘要信息 |
|
点击此处可从《传感技术学报》下载全文 |
|
