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Structural and chemical effects on the SiKβ X-ray emission spectra for silicates and silico-phosphates |
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| Authors: | Toshinori Okura Giichi Sudoh Hiroyuki Inoue Takafumi Kanazawa |
| Affiliation: | 1. Department of Applied Chemistry, Faculty of Engineering, Kogakuin University, Nishishinjuku, Shinjuku-ku, 163-91, Tokyo, Japan 2. Department of Materials Science, Faculty of Engineering, The University of Tokyo, Hongo, Bunkyo-ku, 113, Tokyo, Japan 3. Chiba Institute of Technology, Research Center, Tsudanuma, Narashino, 275, Chiba, Japan |
| Abstract: | The SiKΒ X-ray emission spectra for several silicates and silico-phosphates were measured using a high-resolution X-ray fluorescence spectrometer with two InSb(III) analyser crystals. Molecular orbital calculation analysis for the obtained spectra was performed by a SCC-DV-Xα method and the energy positions and relative intensities of the spectral fine structures were calculated with Slater's transition-state method. The calculated results interpreted the spectral profiles successfully. The energy shifts of the SiKΒ main peak were also discussed in terms of the electronegativity of the second-nearest-neighbour atoms. These shifts were attributed to the changes in the stability of the Si-O bonds due to the existence of second-nearest-neighbour P atoms. |
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