| 开路电压与太阳电池少子寿命关系的推导及其应用的研究 |
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| 引用本文： | 彭银生,陈庭金. 开路电压与太阳电池少子寿命关系的推导及其应用的研究[J]. 太阳能学报, 2008, 29(1): 50-54 |
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| 作者姓名： | 彭银生 陈庭金 |
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| 作者单位： | 1. 海南医学院信息技术部数理教研室,海口,571101
2. 云南师范大学太阳能研究所,昆明,650092 |
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| 基金项目： | 海南医学院校科研和教改项目 |
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| 摘 要： | 从理论上详细推导了晶体硅太阳电池在脉冲光照下,开路电压Voc(t)与少数载流子寿命的关系,同时研究了N-P结势垒电容放电时对Voc(t)的影响;从实验上验证了开路电压随时间的衰减关系,并运用该关系测量了硅太阳电池少数载流子寿命,测量结果较为准确.
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| 关 键 词： | 太阳电池 开路电压衰减法测量 少子寿命 开路电压 晶体硅太阳电池 少子寿命 衰减关系 应用 研究 APPLICATION CARRIER LIFETIME 测量结果 运用 时间 验证 实验 影响 电容放电 势垒 载流子寿命 光照 脉冲 理论 |
| 文章编号： | 0254-0096（2008）01-0050-05 |
| 收稿时间： | 2006-09-12 |
| 修稿时间： | 2006-09-12 |
A STUDY OF THE RELATIONS BETWEEN THE OPEN-CIRCUIT AND MINORITY CARRIER LIFETIME AND APPLICATION |
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| Peng Yinsheng,Chen Tingjin. A STUDY OF THE RELATIONS BETWEEN THE OPEN-CIRCUIT AND MINORITY CARRIER LIFETIME AND APPLICATION[J]. Acta Energiae Solaris Sinica, 2008, 29(1): 50-54 |
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| Authors: | Peng Yinsheng Chen Tingjin |
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| Abstract: | The relations between the open-cireuit vohage and the minority cartier lifetime have been calculated in silicon solar cells, which were excited under the external pulsed light. Moreover, the effect of capacitance on general open-circuit voltage decay was also investigated; This relations between the excess minority cartier lifetime and the open-circuit voltage decay has been validated through experiment, and the minority cartier lifetime in silicon solar cells has been measured, the results showed that it is correct and accurate to measure the minority cartier lifetime. |
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| Keywords: | solar cells measurement of open-circuit voltage decay minority carrier lifetime |
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