| 减少耐光色牢度及热耐光色牢度的测试时间 |
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| 引用本文： | 钟毅. 减少耐光色牢度及热耐光色牢度的测试时间[J]. 国际纺织导报, 2006, 34(5): 59-67,34 |
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| 作者姓名： | 钟毅 |
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| 作者单位： | Atlas材料测试技术公司(德国) |
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| 摘 要： | 描述了多种关于在光照下通过增加辐照度来缩短耐晒试验时间的方法测试耐晒牢度的成功经验.讨论了依据VDA 75202标准方法A的热耐晒色牢度试验和依据ISO 105-B02标准的耐晒色牢度试验.结果表示测试结果不依赖于辐照度.α氙光耐晒色牢度试验机和β氙光耐晒色牢度试验机保证了这一宽泛的辐射范围.
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| 关 键 词： | 耐光色牢度 试验 辐射 |
Shorter test times for light fastness and hot light fastness tests |
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| Artur Schnlein. Shorter test times for light fastness and hot light fastness tests[J]. Shanghai-Frankfurt am Main, 2006, 34(5): 59-67,34 |
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| Authors: | Artur Schnlein |
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| Affiliation: | ATLAS Material Testing Technology GmbH, Linsengericht-Altenhafilau/Germany |
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| Abstract: | The positive experiences related to testing for color fastness under light with regard to shortening the test time throuth increased irradiance are described. Primarily for hot light fastness in accordance with VDA 75202, Method A, but also with respect to tight fastness test in accordance with ISO 105-B02, it has been shown that the test results are independent of the irradiance. The Xenotest Alpha and Xenotest Beta devices ensure this over wide irradiance range. |
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| Keywords: | light fastness test radiation |
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