首页 | 本学科首页   官方微博 | 高级检索  
     

一种选择折叠计数状态转移的BIST方案
引用本文:梁华国, 方祥圣, 蒋翠云, 欧阳一鸣, 易茂祥. 一种选择折叠计数状态转移的BIST方案[J]. 计算机研究与发展, 2006, 43(2): 343-349.
作者姓名:梁华国  方祥圣  蒋翠云  欧阳一鸣  易茂祥
作者单位:1(合肥工业大学计算机与信息学院 合肥 230009)2(安徽行政学院 合肥 230059)3(合肥工业大学理学院 合肥 230009)(hgliang@mail.hf.ah.cn)
基金项目:中国科学院资助项目;安徽省自然科学基金;教育部留学回国人员科研启动基金
摘    要:提出了一种选择折叠计数状态转移的BIST方案,它是在基于折叠计数器的基础上,采用LFSR编码折叠计数器种子,并通过选定的存储折叠距离来控制确定的测试模式生成,使得产生的测试模式集与原测试集相等.既解决了测试集的压缩,又克服了不同种子所生成的测试模式之间的重叠、冗余.实验结果证明,建议的方案不仅具有较高的测试数据压缩率,而且能够非常有效地减少测试应用时间,平均测试应用时间仅仅是类似方案的4%.

关 键 词:内建自测试  折叠计数器  测试数据压缩
收稿时间:2004-09-10
修稿时间:2004-09-102005-07-14

A BIST Scheme Based on Selecting State Transition of Folding Counters
Liang Huaguo, Fang Xiangsheng, Jiang Cuiyun, Ouyang Yiming, Yi Maoxiang. A BIST Scheme Based on Selecting State Transition of Folding Counters[J]. Journal of Computer Research and Development, 2006, 43(2): 343-349.
Authors:Liang Huaguo  Fang Xiangsheng  Jiang Cuiyun  Ouyang Yiming  Yi Maoxiang
Affiliation:1(School of Computer and Information, Hefei University of Technology, Hefei 230009)2(Anhui Administration College, Hefei 230059)3(School of Science, Hefei University of Technology, Hefei 230009)
Abstract:In this paper, a BIST scheme based on selecting state transition of folding counters is presented. On the basis of folding counters, LFSR is used to encode the seeds of the folding counters, where folding distances are stored to control deterministic test pattern generation, so that the generated test set is completely equal to the original test set. This scheme solves compression of the deterministic test set as well as overcomes overlapping and redundancy of test patterns produced by the different seeds. Experimental results prove that it not only achieves high test data compression ratio, but efficiently reduces test application time, and the average test application time is only four percent of the same type scheme.
Keywords:BIST   folding counter   test data compression
本文献已被 CNKI 维普 万方数据 等数据库收录!
点击此处可从《计算机研究与发展》浏览原始摘要信息
点击此处可从《计算机研究与发展》下载全文
设为首页 | 免责声明 | 关于勤云 | 加入收藏

Copyright©北京勤云科技发展有限公司  京ICP备09084417号