| 电子产品寿命检测中异常数据的检验 |
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| 引用本文： | 彭求实. 电子产品寿命检测中异常数据的检验[J]. 电子产品可靠性与环境试验, 2005, 23(5): 10-13 |
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| 作者姓名： | 彭求实 |
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| 作者单位： | 广东商学院数学系,广东,广州,510320 |
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| 摘 要： | 讨论在电子产品的寿命数据中,对同时存在的异常大数据和异常小数据的检验方法,给出了一个明确的判别标准,并以一例说明其应用.
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| 关 键 词： | 指数分布 寿命检测 电子产品 异常数据 |
| 文章编号： | 1672-5468(2005)05-0010-04 |
| 修稿时间： | 2005-03-08 |
Testing for multiple outliers in life testing of electronic products |
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| PENG Qiu-shi. Testing for multiple outliers in life testing of electronic products[J]. Electronic Product Reliability and Environmental Testing, 2005, 23(5): 10-13 |
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| Authors: | PENG Qiu-shi |
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| Abstract: | The test for life data of electronic products with upper outliers and lower outliers was discussed.A clear standard for distinguishing the outliers was given and was illustrated with an example. |
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| Keywords: | exponential distribution life testing electronic product multiple outlier |
| 本文献已被 CNKI 维普 万方数据 等数据库收录！ |
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