On-State Characteristics of SiC power UMOSFETs on 115-/spl mu/m drift Layers |
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| Authors: | Sui Y Tsuji T Cooper JA Jr |
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| Affiliation: | Comput. Eng. & the Birck Nanotechnology Center, Purdue Univ., West Lafayette, IN, USA; |
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| Abstract: | We describe the on-state performance of trench oxide-protected SiC UMOSFETs on 115-/spl mu/m-thick n-type 4H-SiC epilayers designed for blocking voltages up to 14 kV. An on-state current density of 137 A/cm/sup 2/ and specific on-resistance of 228 m/spl Omega//spl middot/cm/sup 2/ are achieved at a gate bias of 40 V (oxide field of 2.67 MV/cm). The effect of current spreading on the specific on-resistance for finite-dimension devices is investigated, and appropriate corrections are made. |
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