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Effects of Annealing Temperature on Properties of ZnO Thin Films Grown by Pulsed Laser Deposition
引用本文:ZHUANG Hui-zhao XUE Shou-bin XUE Cheng-shan HU Li-jun LI Bao-li ZHANG Shi-ying. Effects of Annealing Temperature on Properties of ZnO Thin Films Grown by Pulsed Laser Deposition[J]. 半导体光子学与技术, 2007, 13(2): 150-154
作者姓名:ZHUANG Hui-zhao XUE Shou-bin XUE Cheng-shan HU Li-jun LI Bao-li ZHANG Shi-ying
作者单位:Institute of Semiconductors, Shandong Normal University, Jinan 250014, CHN
摘    要:ZnO thin films are deposited on n-Si(111) substrates by pulsed laser deposition(PLD) system. Then the samples are annealed at different temperatures in air ambient and their properties are investigated particularly as a function of annealing temperature. The microstructure, morphology and optical properties of the as-grown ZnO films are studied by X-ray diffraetion(XRD). atomic force mieroseope(AFM), Fourier transform infrared spectroscopy(FTIR) and photoluminescence(PL) spectra. The results show that the as- grown ZnO films have a hexagonal wurtzite structure with a preferred c-axis orientation. Moreover, the diameters of the ZnO crystallites become larger and the crystal quality of the ZnO fihns is improved with the increase of annealing temperature.

关 键 词:ZnO薄膜 脉冲激光沉积 退火温度 晶体性质
文章编号:1007-0206(2007)02-0150-05
收稿时间:2006-10-08
修稿时间:2006-11-18

Effects of Annealing Temperature on Properties of ZnO Thin Films Grown by Pulsed Laser Deposition
ZHUANG Hui-zhao,XUE Shou-bin,XUE Cheng-shan,HU Li-jun,LI Bao-li,ZHANG Shi-ying. Effects of Annealing Temperature on Properties of ZnO Thin Films Grown by Pulsed Laser Deposition[J]. Semiconductor Photonics and Technology, 2007, 13(2): 150-154
Authors:ZHUANG Hui-zhao  XUE Shou-bin  XUE Cheng-shan  HU Li-jun  LI Bao-li  ZHANG Shi-ying
Abstract:ZnO thin films are deposited on n-Si(111) substrates by pulsed laser deposition(PLD) system.Then the samples are annealed at different temperatures in air ambient and their properties are investigated particularly as a function of annealing temperature.The microstructure,morphology and optical properties of the as-grown ZnO films are studied by X-ray diffraction(XRD),atomic force microscope(AFM),Fourier transform infrared spectroscopy(FTIR) and photoluminescence(PL) spectra.The results show that the as-grown ZnO films have a hexagonal wurtzite structure with a preferred c-axis orientation.Moreover,the diameters of the ZnO crystallites become larger and the crystal quality of the ZnO films is improved with the increase of annealing temperature.
Keywords:annealing temperature  ZnO films  Si substrate  pulsed laser deposition
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