Fully digital strategy for fast calibration and test of ΣΔ ADC's |
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| Authors: | Daniela De Venuto Leonardo Reyneri |
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| Affiliation: | a Dipartimento di Electtrotecnica ed Elettronica, Politecnico di Bari, Via orabona 4, 70125 Bari, Italy
b Dipartimento di Elettronica, Politecnico di Torino, c. so Duca degli Abruzzi 24, 10129 Torino, Italy |
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| Abstract: | This work describes a novel test strategy that uses digital stimuli for cheap, fast, though accurate, testing of high resolution ΣΔ ADC's. Simulation results showed a detection sensitivity on specifications parameters of up to −100 dB. The proposed method can also help to reduce the cost of ADC production test, to extend test coverage and to enable built-in self-test and test-based self-calibration. |
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| Keywords: | Test tecnique High resolution sigma delta ADC |
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