Artifacts in Atomic Force Microscopy |
| |
| Authors: | Gainutdinov R. V. Arutyunov P. A. |
| |
| Affiliation: | (1) Shubnikov Institute of Crystallography, Russian Academy of Sciences, Leninskii pr. 59, Moscow, 117333, Russia;(2) Moscow State Institute of Electronics and Mathematics, Moscow, Russia |
| |
| Abstract: | The origin of artifacts in atomic force microscopy is discussed. They are classified by basic distinct features. Various solutions to this problem are suggested using the literature data. Metrological issues of the problem are touched upon. |
| |
| Keywords: | |
| 本文献已被 SpringerLink 等数据库收录！ |
|
