Study of the Soft and Hard X-Ray Emitted by APF Plasma Focus Device in Different Pressures |
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| Authors: | G R Etaati R Amrollahi M Habibi Kh Mohammadi R Baghdadi A Roomi |
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| Affiliation: | (1) Department of Nuclear Engineering and Physics, Amir Kabir University of Technology, Tehran, Iran;(2) Department of Science, University of Putra, Putra, Malaysia |
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| Abstract: | In this paper, an investigation on the X-rays emitted in different pressures by APF plasma focus devices using filtered PIN-diodes
and fast plastic scintillation detector is reported. The highest X-ray emission was observed in the pressure of 1.6 torr and
the behavior of X-ray intensities registered by different filters versus applied pressure were seemed to be similar. The X-ray
angular distribution was bimodal, peaked approximately at ±18°. The intensity of X-rays decreased abruptly along the central
axis of the device where the cylindrical plasma pinch was formed. |
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