首页 | 本学科首页   官方微博 | 高级检索  
     


Machine-vision-based identification for wafer tracking in solar cell manufacturing
Authors:Du-Ming Tsai  Ming-Chin Lin
Affiliation:Department of Industrial Engineering & Management, Yuan-Ze University, 135 Yuan-Tung Road, Nei-Li, Tao-Yuan, Taiwan, ROC
Abstract:Solar power is getting popular as an alternative of electricity energy. Multicrystalline solar cells dominate the current market share because of lower material and manufacturing costs. In solar cell manufacturing, a silicon ingot is sliced into thin wafers and then the wafers are further processed into solar cells. Conventional automatic identification systems such as bar codes, magnetic strips, OCR and RFID need a contacted identity on the object surface. They are not possible to implement for solar wafer tracking and data collection due to the thin, fragile silicon surface of a solar wafer.
Keywords:Machine vision  Automatic identification  Product tracking  Wavelet transform  Wavelet packets  Histogram intersection  Solar wafer
本文献已被 ScienceDirect 等数据库收录!
设为首页 | 免责声明 | 关于勤云 | 加入收藏

Copyright©北京勤云科技发展有限公司  京ICP备09084417号