| Abstract: | In this paper, it is shown that the tip as well as the cantilever (both conducting) act on the electrostatic force. The experimental results on force versus distance agree with the simulations derived from the Equivalent Charge Model. These simulations allow to determine the influence of geometry of the tip and bending of cantilever on the force exerting on the sensor. So, we predict the tip design and operating conditions (detection mode) to achieve the best resolution, particularly in long distance tip-sample in Electrostatic Force Microscopy. |
