Structural study by X-ray diffraction and transmission electron microscopy of the misfit compound (SbS1−xSex)1.16(Nb1.036S2)2 |
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Authors: | Mohammed Kars,Daniel C. Fredrickson,Sven Lidin,L.C. Otero-Diá z |
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Affiliation: | a Faculté de Chimie, Laboratoire Sciences des Matériaux, USTHB, BP32 16000 Alger, Algeria b Inorganic Chemistry, Arrhenius Laboratory, Stockholm University, 10691 Stockholm, Sweden c Centro de Microscopia Electrónica, Universidad Complutense, 28040 Madrid, Spain d Dpto. Inorgánica, Fac. C.C. Químicas, Universidad Complutense, 28040 Madrid, Spain |
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Abstract: | In the Sb-Nb-S-Se system, a new misfit layer compound (MSL) has been synthesized and its structure was determined by combining single crystal X-ray diffraction (XRD) and transmission electron microscopy (TEM) techniques. It presents a composite crystal structure formed by (SbS1−xSex) slabs stacking alternately with double NbS2 layers and both can be treated as separate monoclinic subsystems. The (SbS1−xSex) slabs comprise a distorted, two-atom-thick layer with NaCl-type structure formed by an array of {SbX5} square pyramids joined by edges (X: S, Se); the NbS2 layers consist of {NbS6} trigonal prisms linked through edge-sharing to form sheets, just as in the 2H-NbS2 structure type. Both sublattices have the same lattice parameters a = 5.7672(19) Å, c = 17.618(6) Å and β = 96.18(3)°, with incommensurability occurring along the b direction: b1 = 3.3442(13) Å for the NbS2 subsystem and b2 = 2.8755(13) Å for the (SbS1−xSex) subsystem. The occurrence of diffuse scattering intensity streaked along c* indicates that the (SbS1−xSex) subsystem is subjected to extended defects along the stacking direction. |
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Keywords: | A. Layered compound B. Crystal growth C. X-ray diffraction D. Crystal structure C. Electron microscopy |
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