EM Modeling of Microstrip Conductor Losses Including Surface Roughness Effect

This letter presents a method to model conductor losses in transmission lines utilizing a commercial full wave solver. The lines consist of multilayered metallization with inherent surface roughness. Metal thickness is assumed to be larger than skin depth. To validate accuracy of the modeling, the measurements of a 50-Omega microstrip line and edge-coupled microstrip filter are provided, with random errors taken into account. Good correlation between the modeled results and measurements has been demonstrated from this comparison