| Abstract: | Some of the problems connected with the characterization of electromigration by means of noise measurements are discussed in this paper. Some specific criticisms moved in the past toward the interpretation of the experimental data are also addressed. In particular, the question of the interpretation of the 1/ƒ2 noise component is discussed. Finally, a set of rules are given which should be followed, both in the choice of the instrumentation and in performing the measurements, in order to obtain meaningful and reliable results. |
