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直流磁控溅射技术制备TiNxOy薄膜
引用本文:陈尔东,王聪,杨海刚,朱开贵.直流磁控溅射技术制备TiNxOy薄膜[J].中国材料科技与设备,2008,5(1):49-51.
作者姓名:陈尔东  王聪  杨海刚  朱开贵
作者单位:北京航空航天大学凝聚态物理与材料物理研究中心,北京100083
基金项目:国家自然科学基金资助项目(50471004);新世纪优秀人才支持计划资助(NCET-05-0197)
摘    要:利用直流磁控溅射技术在玻璃衬底上制备了TiNxOy薄膜样品。发现薄膜的颜色、晶体结构、光学性质等都强烈依赖于反应气体的流量。利用光电子能谱(XPS)、X射线衍射(XRD)、UV—Vis分光光度计、扫描电子显微镜(SEM)等测试手段对样品进行表征。结果表明:随着O2流量的逐步增加,薄膜逐渐呈现非晶态,晶粒逐渐变小。薄膜结构从TiN到TiNxOy再向TiO2过渡。透射光谱显示从TiN的不透明逐渐增加到透明度为80%,且吸收阈发生蓝移。

关 键 词:TiNxOy  直流磁控溅射  吸收光谱  微观形貌

Preparation of TiNxOy Films by Direct Current Magnetron Sputtering
CHEN Er-dong,WANG Cong ,YANG Hai-gang , ZHU Kai-gui.Preparation of TiNxOy Films by Direct Current Magnetron Sputtering[J].Chinese Materials Science Technology & Equipment,2008,5(1):49-51.
Authors:CHEN Er-dong  WANG Cong  YANG Hai-gang  ZHU Kai-gui
Affiliation:(Center of Condensed Matter and Material Physics, Beihang University, Beijing,100083, China)
Abstract:TiNxOy thin films were prepared on glass substrates by direct current (DC) magnetron sputtering. The color, crystal structure, optical properties of the films were characterized by X-ray photoelectron spectroscopy (XPS), X-ray diffraction (XRD), UV-Vis spectrophotometer and scanning electron microscopy (SEM). The results showed that: the absorption edge of the thin films was blue shifted. The structure became toward amorphous and the grain size became small with increasing of N2 flowing rate.
Keywords:TiNxOy  DC magnetron sputtering  Absorption spectra  Microstructure
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