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加速极限试验方法综述
引用本文:王文岳. 加速极限试验方法综述[J]. 电子产品可靠性与环境试验, 2014, 32(6): 57-61
作者姓名:王文岳
作者单位:工业和信息化部电子第五研究所华东分所,江苏 苏州,215011
摘    要:介绍了高加速极限试验(HALT)与传统的可靠性试验的差异性,以及HALT和高加速应力筛选(HASS)技术及其应用;并对HALT/HASS技术的实施方案,HALT/HASS试验中应注意的问题,以及如何正确地看待HALT/HASS技术在产品研发与生产中的作用等内容进行了综述。

关 键 词:高加速寿命试验  高加速应力筛选  可靠性试验

Overview of HALT/HASS Test Methods
WANG Wen-yue. Overview of HALT/HASS Test Methods[J]. Electronic Product Reliability and Environmental Testing, 2014, 32(6): 57-61
Authors:WANG Wen-yue
Affiliation:WANG Wen-yue (CEPREI-EAST, Suzhou 215011, China)
Abstract:A comparison between traditional reliability test and highly accelerated Limit test( HALT/HASS) is presented. The specific technologies and applications of Highly Accelerated Limit Test(HALT) and Highly Accelerated Stress Screening(HASS) are introduced. The implementation scheme of HALT/HASS techniques and the issues that should be considered in the application are summarized. How to consider the role of HALT/HASS techniques in the product RD and manufacturing and their appropriate application are discussed in the end.
Keywords:Highly Accelerated Limit Test(HALT)  Highly Accelerated Stress Screening(HASS)  reliability test
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