| 换路过渡过程及相关的电子仪器故障分析 |
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| 引用本文： | 刘振善. 换路过渡过程及相关的电子仪器故障分析[J]. 信息技术, 2003, 27(11): 72-73,84 |
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| 作者姓名： | 刘振善 |
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| 作者单位： | 中国电子科技集团公司第四十九研究所,哈尔滨,150001 |
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| 摘 要： | 仪器性能达不到原设计技术条件要求的称为故障。故障是从仪器内部和外部电路发生新的“换路”开始，以引起储能元件状态的变化而产生了“过渡过程”结束之后生成。从“换路”的四种情况阐述了造成故障的机理，并定性分析、定量估算过渡过程的方法。
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| 关 键 词： | 零输入响应 零状态响应 稳态响应 暂态响应 |
| 文章编号： | 1009-2552(2003)11-0072-02 |
The analysis of "circuit-changing" process and related electronic instrument faults |
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| LIU Zhen-shan. The analysis of "circuit-changing" process and related electronic instrument faults[J]. Information Technology, 2003, 27(11): 72-73,84 |
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| Authors: | LIU Zhen-shan |
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| Abstract: | The reason that the designed specifications cannot be reached is faults. The faults start from the "circuit-changing" of inner and external circuit of instruments, causing the changing of stored-element state, and end with the finishing of "transient-process". This article introduces the theory to cause this kind of fault from four aspects, and the methods to analyze "transient-process" qualitatively and quantitatively are discussed. |
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| Keywords: | zero input response zero state response stable state response transient state response |
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