首页 | 本学科首页   官方微博 | 高级检索  
     

偏光干涉法测量液晶的双折射率
引用本文:彭敦云,宋连科,栗开婷,郭文静. 偏光干涉法测量液晶的双折射率[J]. 激光技术, 2014, 38(3): 422-424. DOI: 10.7510/jgjs.issn.1001-3806.2014.03.030
作者姓名:彭敦云  宋连科  栗开婷  郭文静
作者单位:1.山东省激光偏光与信息技术重点实验室, 曲阜 273165;
摘    要:为了测量液晶双折射率,从偏光干涉的理论公式入手,通过一定的近似,采用偏光干涉法测量液晶双折射率,进行了理论分析和实验验证,获得了较为理想的数据。结果表明,在采用偏光干涉法测量液晶材料的双折射率时,避免了对透射光谱的绝对光强进行测量,使得测量结果具有较高的精度。这一结果对液晶器件的设计、制作和使用是有帮助的。

关 键 词:测量与计量   液晶   电光效应   偏光干涉   双折射率
收稿时间:2013-06-23

Measurement of birefringence of liquid crystal with polarized light interference method
Abstract:In order to measure the liquid crystal birefringence,a simple and accurate method called polarization interferometry was used from the theoretical formula of polarized light interference and by making a certain approximation. More satisfactory data were achieved by theoretically analysis and experimental verification. The results show the use of polarized light interferometry to measure the liquid crystal material avoids the measurement of the absolute intensity of transmission spectrum, and has high accuracy. It is helpful for the design, manufacture and application of liquid crystal device.
Keywords:measurement and metrology  liquid crystal  electro-optic effect  polarized light interference  birefringence
本文献已被 CNKI 等数据库收录!
点击此处可从《激光技术》浏览原始摘要信息
点击此处可从《激光技术》下载免费的PDF全文
设为首页 | 免责声明 | 关于勤云 | 加入收藏

Copyright©北京勤云科技发展有限公司  京ICP备09084417号