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一种间隙弱化爆炸零门的仿真与试验
引用本文:李燕华,李元,李晓刚,熊诗辉,温玉全.一种间隙弱化爆炸零门的仿真与试验[J].含能材料,2016,24(10):1005-1010.
作者姓名:李燕华  李元  李晓刚  熊诗辉  温玉全
作者单位:北京理工大学爆炸科学与技术国家重点实验室,北京,100081
基金项目:武器装备预先研究项目(40XX4010X)
摘    要:为了提高爆炸零门的作用可靠性,利用ANSYS/LS-DYNA程序对装药尺寸为0.8 mm×0.8 mm,不同间隙厚度的传统间隙零门和间隙弱化零门进行了数值模拟和理论分析,并通过试验对仿真结果进行了验证。仿真和试验结果表明,在传统间隙零门的基础上,增加间隙厚度,并增设圆形空气隙来弱化零门间隙强度,有助于冲击波的衰减和零门间隙的打开,零门间隙厚度的可靠性窗口从0.6~0.7 mm提高为0.7~1.0 mm,明显提高了爆炸零门的作用可靠性。

关 键 词:爆炸逻辑网络  爆炸零门  可靠性  数值模拟
收稿时间:3/2/2016 12:00:00 AM
修稿时间:2016/4/21 0:00:00

Numerical Simulation and Experimental Study of Weak Gap Explosive Null Gate
LI Yan-hu,LI Yuan,LI Xiao-gang,XIONG Shi-hui and WEN Yu-quan.Numerical Simulation and Experimental Study of Weak Gap Explosive Null Gate[J].Chinese Journal of Energetic Materials,2016,24(10):1005-1010.
Authors:LI Yan-hu  LI Yuan  LI Xiao-gang  XIONG Shi-hui and WEN Yu-quan
Affiliation:State Key Laboratory of Science and Technology, Beijing Institute of Technology, Beijing 100081, China,State Key Laboratory of Science and Technology, Beijing Institute of Technology, Beijing 100081, China,State Key Laboratory of Science and Technology, Beijing Institute of Technology, Beijing 100081, China,State Key Laboratory of Science and Technology, Beijing Institute of Technology, Beijing 100081, China and State Key Laboratory of Science and Technology, Beijing Institute of Technology, Beijing 100081, China
Abstract:In order to improve the function reliability of explosive null gate, the traditional and weak gap explosive null gate whose charge size are 0.8 mm×0.8 mm with different gap thicknesses are simulated by ANSYS/LS-DYNA software, and the simulation results are verified through experiments. The simulation results and experimental results show that an additional round air groove on the basis of traditional gap explosive null gate could contribute to shock attenuation and gap breakage. Gap window of the null gate for reliable action is increased from 0.6-0.7 mm to 0.7-1.0 mm, which improve the function reliability of gap null gate.
Keywords:explosive logic circuit  explosive null gate  reliability  numerical simulation
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