Tunnel Junction as a Noise Probe |
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Authors: | Edouard B Sonin |
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Affiliation: | (1) Racah Institute of Physics, Hebrew University of Jerusalem, Jerusalem, 91904, Israel;(2) Low Temperature Laboratory, Helsinki University of Technology, 02015 HUT, Finland |
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Abstract: | The paper investigates theoretically effects of noise on low-bias parts of IV curves of tunnel junctions. The analysis starts
from the effect of shot noise from an additional (noise) junction on the Coulomb blockaded Josephson junction in high-impedance
environment. Asymmetry of shot noise characterized by its odd moments results in asymmetry of the IV curve of the Josephson
junction. At high currents through the noise junction the IV curve is sensitive to electron counting statistics. The theory
is generalized on another type of noise (phase noise of a monochromatic AC input) and on a normal Coulomb blockaded tunnel
junction. The effect of shot noise on the IV curve of a superconducting Josephson junction in low-impedance environment is
also analyzed. From this effect one can obtain information on the time necessary for an electron to tunnel through the junction
responsible for shot noise. In summary, the analysis demonstrates, that the low-bias part of the IV curves of tunnel junctions
can be a sensitive probe of various types of noise. |
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