Silicon-germanium alloy growth control and characterization |
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Authors: | Leslie I Halberg Joseph H Nevin |
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Affiliation: | (1) Solid State Electronics Laboratory Department of Electrical and Computer Engineering, University of Cincinnati, 45221 Cincinnati, Ohio |
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Abstract: | Silicon-germanium alloy has been grown on silicon substrates by the hydrogen reduction of silicon tetrachloride and germanium
tetrachloride as well as the pyrolysis of silane and germane. The film growth characteristics in the first few minutes have
been studied using an SEM. Techniques have been developed for growing high germanium content films which are single crystal
and have surfaces suitable for MOS device fabrication. |
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Keywords: | silicon-germanium chemical vapor deposition epitaxy |
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