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Silicon-germanium alloy growth control and characterization
Authors:Leslie I Halberg  Joseph H Nevin
Affiliation:(1) Solid State Electronics Laboratory Department of Electrical and Computer Engineering, University of Cincinnati, 45221 Cincinnati, Ohio
Abstract:Silicon-germanium alloy has been grown on silicon substrates by the hydrogen reduction of silicon tetrachloride and germanium tetrachloride as well as the pyrolysis of silane and germane. The film growth characteristics in the first few minutes have been studied using an SEM. Techniques have been developed for growing high germanium content films which are single crystal and have surfaces suitable for MOS device fabrication.
Keywords:silicon-germanium  chemical vapor deposition  epitaxy
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