An accurate method to determine the through-plane electrical conductivity and to study transport properties in film samples |
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| Affiliation: | 1. Nanomaterials Research Institute, Department of Materials and Chemistry, National Institute of Advanced Industrial Science and Technology, 1-1-1 Higashi, Tsukuba, Ibaraki 305-8565, Japan;2. Department of Mechanical Science and Engineering, Chiba Institute of Technology, Tsudanuma 2-17-1 Narashino, Chiba 275-0016, Japan;3. Nanoelectronics Research Institute, Department of Electronics and Manufacturing, National Institute of Advanced Industrial Science and Technology, 1-1-1 Higashi, Tsukuba, Ibaraki 305-8562, Japan;1. Center for Advanced Materials, Shenzhen Institutes of Advanced Technology, Chinese Academy of Sciences, Shenzhen, 518055, China;2. Department of Nano Science and Technology Institute, University of Science and Technology of China, Suzhou, 215123, China;3. Department of Materials Science and Engineering, CAS Key Laboratory of Materials for Energy Conversion, University of Science and Technology of China, Hefei, 230026, China;4. Department of Electronics Engineering, The Chinese University of Hong Kong, Hong Kong, China;1. National Institute of Astrophysics, Optics and Electronics (INAOE), Luis Enrique Erro # 1, Tonantzintla, Puebla, Mexico, C.P. 72840, Mexico;2. CONACyT - INAOE, Luis Enrique Erro # 1, Tonantzintla, Puebla, Mexico C.P 72840, Mexico;1. School of Material and Mineral Resources Engineering, Universiti Sains Malaysia, 14300 Nibong Tebal, Pulau Pinang, Malaysia;2. School of Electrical and Electronic Engineering, Universiti Sains Malaysia, 14300 Nibong Tebal, Pulau Pinang, Malaysia;1. CICECO – Aveiro Institute of Materials, Department of Materials and Ceramic Engineering, University of Aveiro, 3810-193 Aveiro, Portugal;2. CICECO – Aveiro Institute of Materials, Department of Chemistry, University of Aveiro, 3810-193 Aveiro, Portugal |
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| Abstract: | The through-plane conductivity of a film sample is critically important because it largely affects the performance of batteries, capacitors, and thermoelectric devices. In this study, we developed a modified four-probe through-plane electrical conductivity measurement method using a coaxial structure. This method is general and works for free-standing film samples. We studied different samples including a steel sheet, highly oriented pyrolytic graphite, and conducting polymers. We confirmed metallic transportation in the steel sheet and hopping transportation in graphite in the through-plane direction by conducting low temperature measurements at 100 K. In the case of a conducting polymer poly(3,4-ethylenedioxythiophene)/polystyrene sulfonate, the conductivity anisotropic ratio decreases with increasing in-plane conductivity. Temperature dependent measurements show two distinct activation energy regimes in the through-plane direction in PEDOT/PSS but almost no change in the in-plane electrical conductivity activation energy. This could be due to additional carrier paths that occur through the more disordered region (the PSS-rich region) in the through-plane direction. We also examined the Meyer–Neldel rule in PEDOT/PSS and concluded that PEDOT/PSS follows the anti-Meyer–Neldel rule, likely due to the high carrier density in the film. |
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| Keywords: | Anisotropic Conducting polymers Organic electronics Doping |
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