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High operational stability of solution-processed organic field-effect transistors with top-gate configuration
Affiliation:1. Department of Physics, Institute of Advance Materials, Institute of Research and Continuing Education (Shenzhen), Hong Kong Baptist University, Kowloon Tong, Hong Kong;2. School of Physical Science and Technology, Southwest University, Chongqing 400715, China;3. Department of Chemistry, Hong Kong Baptist University, Kowloon Tong, Hong Kong;1. Department of Industrial Engineering (DIIn), University of Salerno, via Giovanni Paolo II, 132, 84084, Fisciano (SA), Italy;2. Polyera Corporation, 8045 Lamon Avenue, Skokie, IL, United States;3. Department of Chemistry and the Materials Research Center, Northwestern University, 2145, Sheridan Road, Evanston, IL, United States;1. Institute of Physics and Applied Physics, Yonsei University, Seoul 120-749, Republic of Korea;2. Department of Physics, Kunsan National University, Gunsan 573-701, Republic of Korea;3. R&D Center, LG Display, Paju-si, Gyeonggi-do 413-779, Republic of Korea;4. Division of Physics, School of General Education, University of Seoul, Seoul 130-743, Republic of Korea
Abstract:Electrical characteristics of top-gate field-effect transistors based on a wide range of solution-processed organic semiconductors are systematically investigated. The top-gate field-effect transistors based on different organic semiconductors—from an amorphous polymer semiconductor to a polycrystalline molecular semiconductor—exhibit higher operational stability compared with bottom-gate organic field-effect transistors reported in literature, in spite of significant difference in field-effect mobility. The correlation between charge transport and operational stability is discussed to gain insight into high operational stability of top-gate organic field-effect transistors.
Keywords:Organic field-effect transistor  Top-gate configuration  High mobility  Bias stress
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