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Resident holes and electrons at organic/conductor and organic/organic interfaces: An electron paramagnetic resonance investigation
Affiliation:1. Department of Chemical Engineering, University of Rochester, Rochester, NY 14627, USA;2. Department of Chemistry, University of Rochester, Rochester, NY 14627, USA;1. Beijing National Laboratory for Molecular Sciences (BNLMS), State Key Laboratory of Rare Earth Materials Chemistry and Applications, College of Chemistry and Molecular Engineering, Peking University, Beijing 100871, PR China;2. Department of Materials Science and Engineering, University of Toronto, 184 College Street, Toronto, Ontario M5S 3E4, Canada;1. Institute of Molecular Science, Innovation Center of Chemistry and Molecular Science, Shanxi University, Taiyuan 030006, PR China;2. Key Laboratory of Materials for Energy Conversion and Storage of Shanxi Province, Taiyuan 030006, PR China;1. ARC Centre of Excellence for Electromaterials Science, Department of Chemistry, Monash University Clayton, Victoria, 3800, Australia;2. Materials Science and Engineering Division, CSIRO, Clayton South, Victoria, 3169, Australia;3. Department of Materials Engineering, Monash University Clayton, Victoria, 3800, Australia
Abstract:A number of organic/conductor and organic/organic interfaces have been examined by EPR spectroscopy to ascertain the areal concentration of organic ions at the interface. Organic hole transport materials such as NPB and TAPC at an interface with MoOx are found to have areal concentrations on the order of 1014 cations per cm2. C60 at an interface with MoOx creates ≈1013 cations per cm2 depending on the roughness of the substrate. However, C60 at an interface with Mg or Ag produces only about 4 × 1012 anions per cm2. Ion concentrations are generally in accord with the energy levels (adiabatic IP, EA etc) of the two materials at a given interface.
Keywords:Interface cations  Dipole layer  OLEDs  Integer charge transfer  Electron paramagnetic resonance
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