|
|||||
|
|
Measurement of EMI induced input offset voltage of an operational amplifier |
|
| Authors: | Redoute J.-M. Steyaert M. |
| Affiliation: | Katholieke Univ. Leuven, Leuven; |
| Abstract: | An efficient measurement technique is introduced for determining the input referred offset voltage induced by electromagnetic interference (EMI) in operational amplifiers. |
| Keywords: | |