A compilation of patents related to mechanical metrology standards and high-precision measurement of mechanical quantities |
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| Affiliation: | 1. Grupo de Projetos Mecânicos, Laboratório Nacional de Luz Síncrotron, Centro Nacional de Pesquisa em Energia e Materiais, R. Giuseppe Máximo Scolfaro, 10000, 13083-100 Campinas, Brazil;2. R. João Rosa, 181, 02255-130 São Paulo, Brazil;3. Coordenadoria de Planejamento e Negócios, Diretoria de Inovação, Instituto de Pesquisas Tecnológicas do Estado de São Paulo, Av. Prof. Almeida Prado, 532, 05508-901 São Paulo, Brazil;4. Laboratório de Metrologia Mecânica, Centro de Metrologia Mecânica, Elétrica e de Fluidos, Instituto de Pesquisas Tecnológicas do Estado de São Paulo, Av. Prof. Almeida Prado, 532, 05508-901 São Paulo, Brazil;1. Dept. of Information Technology and Electrical Engineering, University of Naples “Federico II”, via Claudio 21, 80125 Naples, Italy;2. Dept. of Electrical and Information Engineering, University of Cassino and Southern Lazio, via G. Di Biasio, 43, 03043 Cassino, Italy;1. PGMICRO, UFRGS, 91509-900 Porto Alegre, RS, Brazil;2. Laboratório Nacional de Nanotecnologia, 13083-100 Campinas, SP, Brazil;3. Instituto de Química, UFRGS, 91509-900 Porto Alegre, RS, Brazil;1. School of Instrument Science and Opto-Electronic Engineering, Hefei University of Technology, Hefei 230009, China;2. College of Electronic and Information Engineering, Anhui JIANZHU University, Hefei 230601, China;1. National Metrology Institute of Japan, National Institute of Industrial Science and Technology (AIST), 1-1-1 Umezono, Tsukuba, Ibaraki 305-8563, Japan;2. The Graduate School for the Creation of New Photonics Industries, Hamamatsu, Shizuoka 431-1202, Japan;3. Graduate School of Mechanical Engineering, Pusan National University 2, Busandaehak-ro 63 beon-gil, Geumjeong-gu, Busan 46241, Repubilc of Korea |
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| Abstract: | The paper aims to provide a source of information regarding the measurement of physical quantities, specifically those related to mechanical metrology. Since there is a lack of literature reviews referencing patents as a way of gathering useful information, we performed a systematic search for patents that could solve practical problems in this field. The methodology used focused on one of the most comprehensive patent database, Orbit.com, covering about 70,000,000 documents. This text gives a quick look at the fundamentals of the measurement literature and then points out the state-of-the-art concerning patents in the area of study. Additionally, data analysis shows the trends in the last five decades of patents about the subject. In total, 5686 documents are found and we compiled 10 examples of relevant patents for the quantities Length, Temperature and Mass, making this article a source of information for both scientific and non-scientific metrology community. |
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| Keywords: | Calibration Innovation Primary standards Reference instruments Systematic review |
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