Characterisation and laboratory investigation of a new ultraviolet multi-wavelength measuring system for high-temperature applications |
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| Affiliation: | 1. Department of Civil and Environment Engineering, Worcester Polytechnic Institute (WPI), Worcester, MA 01609-2280, USA;2. Department of Civil and Environmental Engineering, The University of Louisville, Louisville, KY 40292, USA;3. Department of Electrical and Computer Engineering, Texas Tech University, Lubbock, TX 79409-3102, USA;4. Department of Architectural Engineering, Yonsei University, Seoul, 120-749, South Korea;1. Echolight Srl, Lecce, Italy;2. National Research Council, Institute of Clinical Physiology, Lecce, Italy;3. ENEA, Materials Technology Unit, Research Centre of Brindisi, Brindisi, Italy;1. Donlinks School of Economics and Management, University of Science and Technology Beijing, No. 30 Xueyuan Road, Haidian District, Beijing 100083, People’s Republic of China;2. School of Economics and Management, Tsinghua University, No. 30 Shuangqing Road, Haidian District, Beijing 100084, People’s Republic of China;3. Ocean College, Hebei Agricultural University, Hebei 071001, People’s Republic of China;1. Faculty of Science and Industrial Technology, Prince of Songkla University, Surat Thani Campus, Mueang, Surat Thani 84100, Thailand;2. Department of Natural Resource Ecology & Management, Oklahoma State University, Stillwater, OK 74078-6013, USA |
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| Abstract: | In the framework of the HiTeMS project of the European Metrology Research Pogramme (EMRP) a new multi-wavelength device for measurement of high temperatures in industrial applications was developed at INRIM. The apparatus takes advantage of the ultra-violet operation with working wavelengths from 350 nm up, which reduces the possible errors connected with the multi-wavelength approach. The instrument has been characterised in terms of optical and electronic behaviour and some laboratory trials were carried out to verify the reliability of the multi-wavelength approach. The true temperature of a blackbody source at 1300 °C with optical windows of unknown spectral transmittance interposed has been defined. By applying an approach that allows a result to be accepted when a threshold limit is reached, it was found that, when an acceptable result can be obtained, errors are comprised within less than 1% of the temperature of the source. Three others single-band thermometers, at 508 nm, 650 nm and an IR broadband 0.8–1.1 μm, were also used to the purpose of a comparison. It has been found that, when the multi-wavelength approach is applicable, it provides generally better or in few cases, at worst similar results of corrected single-wavelength thermometers. |
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| Keywords: | Radiation thermometry Multi-wavelength Emissivity |
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