Flexible contact stamp for electrical conductivity measurements of a soft matter |
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| Affiliation: | 1. Institute of Measurement and Automatic Control, Leibniz Universität Hannover, Nienburger Straße 17, 30167 Hannover, Germany;2. Institut für Informationsverarbeitung (TNT), Leibniz Universität Hannover, Appelstr. 9A, 30167 Hannover, Germany;1. Center for Mathematical Modeling (CMM), UMI (2807), UCHILE-CNRS, Chile;2. Mining Information Communications and Monitoring (Micomo), Fundación Chile, Chile;1. The Key Laboratory of Solar Thermal Energy and Photovoltaic System, Institute of Electrical Engineering, Chinese Academy of Sciences, No. 6 Beiertiao, Zhongguancun, Beijing, 100190, China;2. CECEP Solar Energy Technology (Zhen Jiang) Co., Ltd, No. 9, Beishan Road, New Area, Zhenjiang, Jiangsu, 212132, China;3. Institute for Energy Technology, Kjeller, Norway |
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| Abstract: | In this communication, a simple homemade four probe conductivity setup has been presented to measure the electrical conductivity of molecularly grafted and passivated solid surfaces. Setup was also extended for the temperature dependent conductivity measurements by designing a small furnace using nichrome heating element. The importance of prepared setup lies in its easy designing ability, portability and reliability to measure the conductivity of soft matters. Setup was designed for four probe conductivity measurements which can be used for two probes conductivity measurements also, depending upon the requirements under investigation. Setup was tested using its four probes for electrochemically grafted indium tin oxide surfaces with thiol containing organic molecules and trichloroethylene passivated Si surface. It was found very sensitive even for observing small changes in current–voltage values whereas recorded curves were quite reproducible. |
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| Keywords: | Molecular grafting Passivation Electrical measurements Temperature dependent electrical measurements |
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