A symmetrical stretching stage for electrical atomic force microscopy |
| |
| Affiliation: | 1. Wroc?aw University of Technology, Faculty of Microsystem Electronics and Photonics, PL-50372 Wroc?aw, Poland;2. Princeton University, Department of Electrical Engineering, Engineering Quadrangle, 08544 NJ, United States;1. School of Mechanical Engineering, Tongji University, 48000 Cao An Road, 201804 Shanghai, PR China;2. Mechanical Engineering Department, Politecnico di Milano, Via La Masa 1, 20156 Milan, Italy;3. Manufacturing Metrology Team, Faculty of Engineering, The University of Nottingham, NG7 2RD Nottingham, UK;1. National Institute of Research on Jute and Allied Fibre Technology, ICAR, 12, Regent Park, Kolkata 700 040, India;2. Indian Institute of Engineering Science and Technology, Shibpur, Botanic Garden, Howrah 711 103, India;1. Department of Civil and Environment Engineering, Worcester Polytechnic Institute (WPI), Worcester, MA 01609-2280, USA;2. Department of Civil and Environmental Engineering, The University of Louisville, Louisville, KY 40292, USA;3. Department of Electrical and Computer Engineering, Texas Tech University, Lubbock, TX 79409-3102, USA;4. Department of Architectural Engineering, Yonsei University, Seoul, 120-749, South Korea;1. Donlinks School of Economics and Management, University of Science and Technology Beijing, No. 30 Xueyuan Road, Haidian District, Beijing 100083, People’s Republic of China;2. School of Economics and Management, Tsinghua University, No. 30 Shuangqing Road, Haidian District, Beijing 100084, People’s Republic of China;3. Ocean College, Hebei Agricultural University, Hebei 071001, People’s Republic of China |
| |
| Abstract: | We present a remotely-controlled device for sample stretching, designed for use with atomic force microscopy (AFM) and providing electrical connection to the sample. Such a device enables nanoscale investigation of electrical properties of thin gold films deposited on polydimethylsiloxane (PDMS) substrate as a function of the elongation of the structure. Stretching and releasing is remotely controlled with use of a dc actuator. Moreover, the sample is stretched symmetrically, which gives an opportunity to perform AFM scans in the same site without a time-consuming finding procedure. Electrical connections to the sample are also provided, enabling Kelvin probe force microscopy (KPFM) investigations. Additionally, we present results of AFM imaging using the stretching stage. |
| |
| Keywords: | Sample stretching Atomic force microscopy Kelvin probe force microscopy |
| 本文献已被 ScienceDirect 等数据库收录！ |
|
