首页 | 本学科首页   官方微博 | 高级检索  
     

基于图像处理的手机软板缺陷自动检测方法
引用本文:曹申,罗意平.基于图像处理的手机软板缺陷自动检测方法[J].计算机测量与控制,2007,15(4):457-459.
作者姓名:曹申  罗意平
作者单位:中南大学CAD/CAM研究所,湖南长沙410075
摘    要:针对手机软板缺陷细小难以检测和缺陷不修复的特殊性,研究了一种新型的手机软板缺陷检测方法;系统利用COMS(Complementary Metal 0xide Semiconductor)摄像头获取被测手机软板的图像,通过图像预处理、边缘增强、图像分割得到二值图像;在检测针孔和基板夹杂的缺陷后,去除瑕疵干扰,与标准模板图像进行匹配,得到全局缺陷;再根据设计准则,判断局部缺陷;实验研究表明,这种检测方法检测速度快、精度高,兼顾传统的参考比较法和非参考法的优点,对常见短路、断路、缺口和凸起等缺陷都可以进行精确的检测.

关 键 词:手机软板  图像处理  缺陷  自动检测  图像处理  手机  软板  缺陷  自动  检测方法  Image  Process  Based  Defects  Board  Mobile  Phone  Method  of  Measurement  断路  短路  考法  参考比较法  精度  检测速度  实验
文章编号:1671-4598(2007)04-0457-03
收稿时间:2006-12-23
修稿时间:2007-01-22

Automatic Measurement Method of Mobile Phone FPC Board Defects on the Based of Image Process
Cao Shen,Luo Yiping.Automatic Measurement Method of Mobile Phone FPC Board Defects on the Based of Image Process[J].Computer Measurement & Control,2007,15(4):457-459.
Authors:Cao Shen  Luo Yiping
Affiliation:Instituteof CAD/CAM , Central South University, Changsha 410075, China
Abstract:For the defects on mobile phoneFPC boardare too tiny to measure by eyes and the defects do not need to be repaired,a new matching measurement method is puts forward.Image is obtained by CMOS(Complementary Metal Oxide Semiconductor)camera,the bi- nary images are acquired after the image pretreatment and the edge enhancement.Once measuring pinhole and flaw,the slight defect disturb- ance is wiped off,it matches with the template to obtain whole defects,part defects are determined by the design judgment criterion.It is showed by experiment that the measurement method is with the characteristics of high speed and high precision,the common defects can be measured accurately.
Keywords:mobile phone FPC board  image process  defects  automatic measurement
本文献已被 CNKI 维普 万方数据 等数据库收录!
设为首页 | 免责声明 | 关于勤云 | 加入收藏

Copyright©北京勤云科技发展有限公司  京ICP备09084417号