Creep of single crystals and polycrystals of aluminum,lead, and tin |
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| Authors: | C. D. Wiseman O. D. Sherby J. E. Dorn |
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| Affiliation: | 1.Institute of Engineering Research,University of California,Oakland,USA;2.University of California,Berkeley,USA |
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| Abstract: | The activation energies for high temperature creep of single crystals and polycrystalline specimens of high purity aluminum, lead, and tin were determined by the technique involving the effect of abrupt changes in temperature on the creep rates. The data reveal that single crystals and polycrystalline specimens have the same high temperature activation energies. Furthermore, the activation energies for grain boundary shearing in aluminum and tin are equal to the respective activation energies for creep. |
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