| Abstract: | Thin fullerite layers are irradiated with 0.1 to 16 MeV electrons and 250 to 500 keV light ions at high fluence, and GeV heavy ions at low fluence. The subsequent analysis by Rutherford backscattering spectrometry revealed that in all cases the energy loss of the analyzing particles in the irradiated samples is enhanced, in comparison to the corresponding pristine samples. This is interpreted as resulting from a compactation of the fullerite films, and indicates an irradiation-induced phase transition towards amorphous, or even diamond-like carbon. |
