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Authors:Toral Marn   S. L. Barrero Garca   F. J. Martnez Torres   R Gallardo Vzquez   S Lillo Moreno   A. J.
Affiliation:Departamento de Ingenieria Electronica, Escuela Superior de Ingenieros de Sevilla, Seville;
Abstract:The authors accept the corrections, pointed out by E.G. Bakhoum, to their original paper (see ibid., vol.48, no.4, p.632-41, Nov. 2005) an apologise for their mistakes
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