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高精度天线测试台结构研究与分析
引用本文:焦洪杰,陈五一,王春洁,樊锐.高精度天线测试台结构研究与分析[J].中国测试技术,2006,32(5):77-78,118.
作者姓名:焦洪杰  陈五一  王春洁  樊锐
作者单位:北京航空航天大学,精密传动技术研究中心,北京,100083
摘    要:介绍了在微波暗室里进行天线精度测量的基本原理,从结构受最大载荷变形后对天线测试台精度的影响这一角度出发,给出了结构参数和变形与整体刚度之间的关系。同时对结构刚度进行详细分析,提出以系统重量最低和比刚度最高的加权因子法的多目标优化函数及优化策略,最后,在研究与分析的基础上,对高精度天线测试台结构特点进行了总结。

关 键 词:天线测量  测试台  变形  精度
文章编号:1672-4984(2006)05-0377-02
收稿时间:2006-03-10
修稿时间:2006-03-102006-05-27

Analyses and research of testing support platform on antenna high precision measurement
JIAO Hong-jie,CHEN Wu-yi,WANG Chun-jie,FAN Rui.Analyses and research of testing support platform on antenna high precision measurement[J].China Measurement Technology,2006,32(5):77-78,118.
Authors:JIAO Hong-jie  CHEN Wu-yi  WANG Chun-jie  FAN Rui
Affiliation:Beijing University of Aeronautics and Astronautics,Research Center of Precision Transmission Technology ,Beijing 100083,China
Abstract:It is very important that antenna target support structure and rigidity during antenna precision measurement in microwave darkroom. Based on the precision effect and requirement, when structure suffered to maximum load, relationship of parameter between structure and distortion was provided.Besides, structure distortion analysis was carried out in detail.In addition, target rigidity/weight ratio and total mass minimizing method were put forward.
Keywords:Antenna measurement  Tesfng support platform  Distortion  Precision
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